0.0
NA
CVE-2026-48176
Memory Corruption via Improper Message Validation
Description

A memory corruption vulnerability caused by improper validation of messages

INFO

Published Date :

Nov. 5, 2026, 3:17 a.m.

Last Modified :

Nov. 5, 2026, 3:17 a.m.

Remotely Exploit :

No

Source :

a8bfbd5c-5645-475e-a8f4-6c140c17bd29
Affected Products

The following products are affected by CVE-2026-48176 vulnerability. Even if cvefeed.io is aware of the exact versions of the products that are affected, the information is not represented in the table below.

No affected product recoded yet

Solution
Address memory corruption by validating incoming messages to prevent crashes.
  • Validate all incoming messages thoroughly.
  • Fix improper message validation logic.
  • Implement robust error handling.
  • Test extensively for memory corruption issues.
References to Advisories, Solutions, and Tools

Here, you will find a curated list of external links that provide in-depth information, practical solutions, and valuable tools related to CVE-2026-48176.

URL Resource
https://semiconductor.samsung.com/support/quality-support/product-security-updates/
CWE - Common Weakness Enumeration

While CVE identifies specific instances of vulnerabilities, CWE categorizes the common flaws or weaknesses that can lead to vulnerabilities. CVE-2026-48176 is associated with the following CWEs:

Common Attack Pattern Enumeration and Classification (CAPEC)

Common Attack Pattern Enumeration and Classification (CAPEC) stores attack patterns, which are descriptions of the common attributes and approaches employed by adversaries to exploit the CVE-2026-48176 weaknesses.

We scan GitHub repositories to detect new proof-of-concept exploits. Following list is a collection of public exploits and proof-of-concepts, which have been published on GitHub (sorted by the most recently updated).

Results are limited to the first 15 repositories due to potential performance issues.

The following list is the news that have been mention CVE-2026-48176 vulnerability anywhere in the article.

The following table lists the changes that have been made to the CVE-2026-48176 vulnerability over time.

Vulnerability history details can be useful for understanding the evolution of a vulnerability, and for identifying the most recent changes that may impact the vulnerability's severity, exploitability, or other characteristics.

  • New CVE Received by a8bfbd5c-5645-475e-a8f4-6c140c17bd29

    Nov. 05, 2026

    Action Type Old Value New Value
    Added Description A memory corruption vulnerability caused by improper validation of messages
    Added CWE CWE-1284
    Added Affected New affected value received. <a href="https://github.com/CVEProject/cvelistV5/blob/main/cves/2026/48xxx/CVE-2026-48176.json">CVE-2026-48176</a>
    Added Reference https://semiconductor.samsung.com/support/quality-support/product-security-updates/
EPSS is a daily estimate of the probability of exploitation activity being observed over the next 30 days. Following chart shows the EPSS score history of the vulnerability.